论文部分内容阅读
,The reliability of AlGaN/GaN high electron mobilitytransistors under step-electrical stresses
【作 者】
:
【机 构】
:
School of Technical Physics, Xidian University, Xi’an 710071, China“,”Key Laboratory for Wide Band-G
【出 处】
:
中国物理B(英文版)
【发表日期】
:
2011年12期
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