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本文介绍的测量装置,能测量离1到500兆赫载频20赫到50千赫频率内的相位噪声的谱密度。本文只讲述到50兆赫的测量情况。测量装置的剩余单边带相位噪声功率与信号功率之比,在离载波20赫时为-142分贝/赫,离载频大于5千赫时减小到背景噪声-172分贝/赫。除去观测时相位起伏高斯分布引起的随机读数误差。可达到的计标校准精度为±0.8分贝。计标的16测量重复性为0.7分贝(测试中百分之七十的观测,都在平均值±0.7分贝以内)。这种测试装置能够表征现有原子频率标准、晶体振荡器、频率合成器及比以前更精密的高质量源的相位噪声特性。能把读数起伏减到最小的系统设计,可进一步提高精度,从而可以把减小系统误差所用的校准系数测得更准,将操作错误和偏差的可能性减到最小。
The measuring device described in this article measures the spectral density of phase noise in the frequency range from 20 Hz to 50 kHz from 1 to 500 MHz. This article only describes the measurement up to 50 MHz. The ratio of the remaining single-sideband phase noise power of the measuring device to the signal power is -142 dB / Hz at 20 Hz from the carrier and -172 dB / Hz at background frequencies greater than 5 kHz. Remove the random reading error caused by observing phase fluctuation Gaussian distribution. The calibration accuracy achievable is ± 0.8 dB. Gauge 16 measures repeatability of 0.7 dB (70% of the observations in the test, both within ± 0.7 dB of mean). This test setup characterizes the phase noise characteristics of existing atomic frequency standards, crystal oscillators, frequency synthesizers, and more sophisticated high-quality sources than ever before. System designs that minimize reading fluctuations can further improve accuracy, so that the calibration coefficients used to reduce systematic errors can be measured more accurately, minimizing the chance of operational errors and deviations.