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介绍了荧光寿命的测试原理。设计了荧光寿命测试系统。利用脉冲取样技术测试了Nd∶GGG晶体的荧光寿命,约为250μs。采用英国的荧光光谱仪,在室温条件下,用波长为488nm的Ar离子激光器激发Nd:GGG晶体,获得了Nd:GGG晶体的荧光光谱,计算出的Nd∶GGG晶体的受激发射截面σ(λ)为21.57×10-20cm2。
The principle of fluorescence lifetime testing is introduced. Fluorescence lifetime test system was designed. Fluorescence lifetime of Nd: GGG crystals was measured by pulse sampling technique, which is about 250μs. Fluorescence spectra of Nd: GGG crystals were obtained by exciting a Nd: GGG crystal with an Ar ion laser at a wavelength of 488 nm at room temperature using a UK fluorescence spectrometer. The calculated stimulated emission cross section σ (λ ) Is 21.57 × 10-20 cm 2.