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随着在弱光探测量子通讯领域研究的深入,光子探测逐渐成为国内外研究的热点。基于Si单光子雪崩光电二极管探测系统,介绍了系统相关性能参数以及相应的测试方法,对主要结构、性能指标和外界环境条件进行了综合性分析,总结并设计了一套完整的测试平台以及测试手段用于对单光子探测系统主要性能进行测试。测试平台采用主动与被动淬火电路两种方式对样品进行测试,结果表明了其相关参数与外偏置电压的非简单线性关系,与理论推理进行比较验证,并讨论了测试平台的优化方案。
With the deepening research in the field of low light detection quantum communication, photon detection has become a hot research field at home and abroad. Based on Si single photon avalanche photodiode detection system, the relevant performance parameters of the system and the corresponding test methods are introduced. The main structure, performance indicators and external environmental conditions are analyzed comprehensively, and a complete set of test platform and test Means for single-photon detection system to test the main performance. The test platform adopts two ways of active and passive quenching circuits to test the samples. The results show the non-simple linear relationship between the related parameters and the external bias voltage, and verify with theoretical reasoning. The optimization scheme of the test platform is also discussed.