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目的:建立蒙脱石中α-SiO2定量分析的X-射线粉末衍射法。方法:应用X-射线衍射(XRD)分析测试技术和JADE定量分析应用软件。结果:标准曲线回归方程为C=-0.01318+0.0348A(r=0.9789)。6%,10%,15%3个含量样品的平均回收率分别为97.8%,96.4%,96.0%(n=10)。结论:X-射线衍射法对蒙脱石中的α-SiO2进行定量测定是一种简捷、可行的分析方法。
Objective: To establish an X-ray powder diffraction method for quantitative analysis of α-SiO 2 in montmorillonite. Methods: X-ray diffraction (XRD) analysis techniques and JADE quantitative analysis application software were applied. Results: The standard curve regression equation was C=-0.01318+0.0348A (r=0.9789). The average recoveries of 3%, 10% and 15% samples were 97.8%, 96.4% and 96.0%, respectively (n=10). Conclusion: The quantitative determination of α-SiO2 in montmorillonite by X-ray diffraction method is a simple and feasible method.