论文部分内容阅读
混合信号测试系统一般用于射频或微波电路S参数的测量,但由于厂家无完整的校准方案和软件支持,提供的校准方案只能校准到特定的测量端面,实际测试时端口需要延伸;并且,系统将引入较大的失配和损耗误差,测量结果不能反映器件的真实性能指标,高精度测量受限。以业界主流的大型射频混合信号测试系统LTX-MX为例,分析S参数测量时的系统误差模型和校准方法,为测试工程师使用大型测试系统准确测量S参数提供了一种校准方案,并为后续的高精度测量提供了可行性。
The mixed signal test system is generally used for the measurement of S-parameters of RF or microwave circuits. However, since the manufacturer does not have a complete calibration solution and software support, the calibration solution provided can only be calibrated to a specific measurement end. In actual test, the port needs to be extended. The system will introduce a larger mismatch and loss error, the measurement results can not reflect the real performance of the device, high-precision measurement is limited. Taking the mainstream large-scale RF mixed signal test system LTX-MX as an example, the system error model and calibration method for S-parameter measurement are analyzed to provide a calibration solution for test engineers to accurately measure S parameters with large test systems. The high-precision measurement provides the feasibility.