一维光子晶体的对称缺陷模特性

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基于介质薄膜理论,设计了含对称缺陷的一维光子晶体结构,用传输矩阵法研究了该对称缺陷晶体的带结构及缺陷模的变化特点。结果显示,随缺陷层个数增大,缺陷模的峰值会增大,宽度会变窄;随缺陷层厚度增大,缺陷模会向长波方向移动,在一定厚度下会出现多缺陷模特点。随周期单元个数变大,缺陷模个数会减少,最终获得一窄带缺陷模。随周期单元厚度增大,禁带宽度明显变宽,缺陷模会变宽并出现右移特性。这些结果对设计新型光子晶体器件有着重要意义,如实现光波滤波器的可控选频、频带缩放功能等。 Based on the theory of dielectric thin film, a one-dimensional photonic crystal structure with symmetric defects was designed. The transfer matrix method was used to study the band structure and the variation characteristics of the defect modes of the symmetric defect crystal. The results show that with the increase of the number of defect layers, the peak value of the defect modes will increase and the width will be narrower. As the defect layer thickness increases, the defect modes will move to the long-wave direction. As the number of periodic elements becomes larger, the number of defect modes will decrease, finally a narrowband defect mode will be obtained. As the thickness of the periodic element increases, the band gap broadens obviously and the defect mode becomes wider and shifts to the right. These results for the design of new photonic crystal devices is of great significance, such as the realization of light-wave filter controllable frequency selection, band zoom function.
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