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报道了一种新颖的用于平面内位移测量的相移和载波技术。在剪切束电子斑纹图干涉度量术中，照明光束由棱镜分为两个波前，棱镜的侧面移动将引入相移。在棱镜后加一小角光楔，则光楔的转动产生载波条纹。棱镜或光楔的转动可由机械或电学机构精密控制。形变信息由数字图像处理算法，相位迭代和傅里叶变换法给出。文中介绍了理论及其实验演示的结果
A novel phase shift and carrier technique for in-plane displacement measurement is reported. In shear beam electron zebra pattern interferometry, the illumination beam is split into two wavefronts by a prism, and the prism’s side motion introduces a phase shift. After the prism plus a small angle wedge, the light wedge rotation carrier strip generated. Prisms or wedges can be precisely controlled by mechanical or electrical mechanisms. Deformation information is given by digital image processing algorithms, phase iterations, and Fourier transform. The article describes the results of the theory and experimental demonstration