介绍了光束方向漂移的精确检测方法，提出了泰伯（Ｔａｌｂｏｔ）效应的一个新用途。采用本系统对半导体激光源的方向漂移角进行了检测。最后，通过进一步检测，初步研究了光学器件对光束方向稳定性的影响。 An accurate detection method of beam direction drift is introduced and a new use of Talbot effect is proposed. The system is used to detect the direction drift angle of the semiconductor laser source. Finally, through further testing, preliminary study of the optical device on the direction of the beam stability.