本文介绍了国外微型计算机的抗辐射加固的一般情况．为方便起见，首先简单介绍了电子器件核辐射产生的五大效应，即位移效应、电离效应、瞬时效应、电磁脉冲效应和单粒子效应，尔后介绍了电子器件抗辐射加固的概况以及抗辐射加固的微型计算机． This article describes the general situation of anti-radiation reinforcement of foreign microcomputers. For the sake of convenience, the five effects of nuclear radiation of electronic devices are introduced briefly first, namely the displacement effect, the ionization effect, the transient effect, the electromagnetic pulse effect and the single-particle effect. Then the introduction of the anti-radiation reinforcement of the electronic device and the anti-radiation reinforcement Microcomputer.