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在白宝石 (sapphire)衬底上低温外延生长出了MgxZn1 -xO晶体薄膜 .x射线衍射 (XRD)及能量色散x射线 (EDX)分析表明 ,MgxZn1 -xO薄膜的晶体结构依赖于薄膜中Mg的组分x,随着Mg组分的增大 ,MgxZn1 -xO薄膜的结构从与ZnO晶体一致的六方结构转变为与MgO晶体一致的立方结构 .对MgxZn1 -xO薄膜的紫外透射光谱及紫外光致荧光谱 (UVPL)的分析表明 ,随着Mg组分的增大 ,光学吸收边产生明显的蓝移 ,表明MgxZn1 -xO晶体薄膜的带隙增大 ,且带隙连续可调 .吸收光谱和XRD测量显示 ,带隙高达 5 6 5eV的MgxZn1 -xO晶体薄膜与MgO之间的晶格失配仅为0 16 % .
X-ray diffraction (XRD) and energy dispersive X-ray (EDX) analysis show that the crystal structure of MgxZn1-xO films depends on the growth of MgxZn1-xO thin films on the sapphire substrates With the increase of Mg content, the structure of MgxZn1-xO thin film changes from the hexagonal structure consistent with ZnO crystal to the cubic structure consistent with MgO crystal.The UV transmission spectra of MgxZn1-xO thin film and UV-induced Fluorescence spectrum (UVPL) analysis shows that with the increase of Mg content, there is a clear blue shift of the optical absorption edge, indicating that the bandgap of MgxZn1-xO films increases and the bandgap is continuously adjustable. The absorption spectra and XRD The measurement shows that the lattice mismatch between MgxZn1-xO crystal with band gap up to 565eV and MgO is only 0 16%.