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引言 用云纹(Moire)法测量位移是极为引人注目的。云纹法通过观察等位移线的等值线图的分布场,确定变形体的位移场。严格地讲云纹属于几何效应,对弹性体,非弹性体,各向同性体及各向异性体的位移同样地反映良好。已经研究成功测定结构及结构部件面内及离面位移的多种云纹技术,但是几乎所有以前的研究工作使用的都是40线/毫米即1000线/英寸的较粗的光栅,或者更粗一些。这只能测定较大的位移,例如高延性材料的面内弹性位移及结构材料的非弹性位移。
Introduction Moire method to measure displacement is extremely attractive. The moire method determines the displacement field of the deformed body by observing the distribution field of the contour map of the displaced lines. Strictly speaking, the moire belongs to the geometric effect and similarly reflects the displacement of the elastomer, nonelastomer, isotropy and anisotropy. Much variety of moiré techniques have been investigated for the successful determination of in-plane and out-plane displacements of structural and structural components, but almost all previous research uses thicker gratings of 40 lines / mm or 1000 lines / inch, or more coarse some. This can only determine large displacements, such as in-plane elastic displacements of highly ductile materials and inelastic displacements of structural materials.