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本文介绍的SACV法是在Ecor±30mv范围内对腐蚀体系进行控制电势的(+)、(-)向线性单周扫描,扫描速率为60、6、0.6mv/s,用它研究铁在IN和IO N HCI中以及加有0.001至1M甲醛时的腐蚀行为,所得Ⅰ～Ⅴ曲线一般都有“滞后环”。本文结合各体系的腐蚀机理,考虑了双层电容充电、扩散迟缓和表面过程迟缓等因素对滞后环的成因进行了分析,说明该法除能快速方便地测量腐速外,还能提供一定的真实腐蚀机理信息。
The SACV method described in this paper is a (+), (-) linear one-week scanning of the corrosion potential in the range of Ecor ± 30mv with a scan rate of 60,6 and 0.6mv / s. It is used to study the effect of iron in IN And IO N HCI and the addition of 0.001 to 1 M formaldehyde corrosion behavior, the resulting Ⅰ ~ V curve generally have a “hysteresis loop.” In this paper, the causes of the hysteresis loop are analyzed considering the corrosion mechanism of each system, considering the factors such as charging, diffusion delay and slow surface process of the double-layer capacitor. It shows that the method can not only quickly and conveniently measure the corrosion rate but also provide certain Real corrosion mechanism information.