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为了研究氧化铅的半导体性能,需要制备和分析高纯氧化铅。对于“六个九”样品要求分析其中几十个杂质,包括常见元素在内,杂质总量必须小于1ppm。因而对单个元素必须有极高的分析灵敏度,并且对样品的预处理和分析过程中使用的试剂以及环境皆有很高的要求。这样,常用的分析方法难于达到要求。火花源质谱仪有高灵敏度和多个元素同时测定的特点。由于氧化铅是一种微晶粉状物质,为了用火花源质谱仪进行分
In order to study the semiconductor properties of lead oxide, high purity lead oxide needs to be prepared and analyzed. For “six nine” samples require analysis of dozens of impurities, including common elements, the total amount of impurities must be less than 1ppm. Therefore, a single element must have extremely high analytical sensitivity, and there are high demands on the reagents and the environment used in the sample pretreatment and analysis. In this way, the commonly used analytical methods are difficult to meet the requirements. Spark source mass spectrometer has the characteristics of high sensitivity and simultaneous determination of multiple elements. Since lead oxide is a microcrystalline powder material, in order to use spark source mass spectrometer for points