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For Hall measurement under different magnetic fields at LN_2 temperature,Hg_(1-x)Cd_xTe (MCT) film (radius 1 cm) grown on CdTe substrate by LPE is photoengraved into many small Van Der Pauw squares,then their Hall coefficients and mobilities are measured and analyzed,respectively.Two films were Hall-tested during the temperature range from LHe 4.2 K to about 200 K.An actual impression on the uniformity of electrical parameters for MCT film can obtained by means of the methods presented in this paper.
For Hall measurement under different magnetic fields at LN_2 temperature, Hg_ (1-x) Cd_xTe (MCT) film (radius 1 cm) grown on CdTe substrate by LPE is photoengraved into many small Van Der Pauw squares, then their Hall coefficients and mobilities are measured and analyzed, respectively. Two films were Hall-tested during the temperature range from LHe 4.2 K to about 200 K. An actual impression on the uniformity of electrical parameters for MCT film can be obtained by means of the methods presented herein in this paper.