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讨论了影响波分复用薄膜滤光片中心波长漂移的因素 ,着重分析了滤光片的温度稳定性。根据实验结果 ,借助于高桥模型 ,分析计算了滤光片的折射率温度系数、线膨胀系数和泊松比以及它们对温度漂移的影响。得到了Ta2 O5/SiO2 滤光片薄膜的折射率温度系数、线膨胀系数、泊松比分别为 1× 10 -5℃-1,5× 10 -7℃-1和 0 12 ,指出了这三个参量是影响温度稳定性最重要的因素 ,特别是薄膜的折射率温度系数。对特定的基板热膨胀系数 ,通过调节滤光片的干涉级次和间隔层材料 ,可望得到零温度漂移的稳定滤光片。
The factors affecting the wavelength shift of the WDM thin film filter are discussed, and the temperature stability of the filter is analyzed emphatically. Based on the experimental results, with the aid of the Takahashi model, the refractive index temperature coefficient, linear expansion coefficient and Poisson’s ratio of the filter and their influence on temperature drift are analyzed and calculated. The refractive index temperature coefficient, coefficient of linear thermal expansion and Poisson’s ratio of Ta2 O5 / SiO2 filter film were obtained respectively at 1 × 10 -5 ℃ -1, 5 × 10 -7 ℃ -1 and 0 12, indicating that these three The parameters are the most important factors affecting the temperature stability, especially the refractive index temperature coefficient of the film. For a given substrate thermal expansion coefficient, by adjusting the filter interference level and the spacer material, is expected to get zero temperature drift of the stability of the filter.