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扫描近场光学显微术是８０年代后期发展起来的一种分辨率超过衍射极限的新型光学显微镜技术。本文介绍了国外最近出现的“禁戒光”近场光学显微镜系统的工作原理及结构。透射式ＳＮＯＭ中部分光沿着光轴向前传播；部分光沿着大于全内反射临界角的方向传播。前者称为允许光；后者称为禁戒光。应用“禁戒光”近场光学显微镜可同时获得三幅图像，即允许光像、禁戒光像和反映样品表面形貌的剪切力图像。禁戒光图像能够提供很好的对比度和分辨率。
Scanning near-field optical microscopy is a new type of optical microscopy developed in the late 1980s that exceeds the diffraction limit. This article introduces the working principle and structure of the “forbidden light” near-field optical microscope system that appears recently abroad. Part of light propagates forward along the optical axis in a transmissive SNOM; part of the light propagates in a direction that is greater than the critical angle of total internal reflection. The former is called allow light; the latter is called forbidden light. By using “forbidden light” near-field optical microscope, three images can be obtained at the same time, that is, light images, forbidden light images and shear images that reflect the surface topography of the sample. Forbidden light images provide good contrast and resolution.