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在SRAM抗辐射加固设计中,纠错编码(Error Correcting Code,ECC)是一种解决空间环境中SRAM单粒子翻转效应的有效方法。但目前国内外对于基于ECC加固的SRAM可靠性评估体系的研究并不完全成熟,还没有一个统一的标准。基于空间环境下SRAM所产生软错误的错误分布图样特性和错误重叠特性,对已有的基于ECC加固的SRAM空间可靠性评估方案进行修正,得到了一种更加精确的评估模型。
Error Correcting Code (ECC) is an effective method to solve the single-chip SRAM flip-flop effect in SRAM. However, at present, the research on SRAM reliability assessment system based on ECC reinforcement is not yet mature at home and abroad, and there is no unified standard yet. Based on the error distribution patterns and error overlapping characteristics of soft errors generated by SRAM in space environment, the reliability assessment scheme of SRAM space based on ECC is modified and a more accurate evaluation model is obtained.