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The symmetrical superlattice intrinsic stacking faults(SISFs)formed on {111} planes are thepredominant crystal defects in polycrystalline Ni_3AI after slight deformation at room temper-ature.The formation of this kind of SISF is resulted from the dipoles which are distributed onthe neighboring {111} planes after reorientation,dissociation and annihilation under appliedstress.
The symmetrical superlattice intrinsic stacking faults (SISFs) formed on {111} planes are the predominant crystal defects in polycrystalline Ni_3AI after slight deformation at room temper-ature. The formation of this kind of SISF is resulted from the dipoles which are distributed on the neighboring {111} planes } planes after reorientation, dissociation and annihilation under appliedstress.