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对于透射电子显微镜摄得的选区电子衍射谱,利用矩阵方法来分析两相间的取向关系,可以验证其标定的结果;判别两相间电子衍射谱相重性的规律;精确地标定丝织构状态的两相复合电子衍射谱;还可以利用计算机使计算不仅方便而且速度快。
For the selected electron diffraction (XRD) diffraction pattern taken by transmission electron microscope, the matrix method is used to analyze the orientation relationship between the two phases to verify the calibration results; to determine the regularity of the phase contrast between the two phases; to accurately calibrate the silk texture state Two-phase composite electron diffraction spectrum; also can make use of computer to make calculations not only convenient but also fast.