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本文叙述在HL-1装置上做的真空紫外区(300-2000A)光谱实验。用微通道板象增强器摄出了等离子体光谱,对光谱进行了辨认和分析;采用光电法测量了谱线随时间的变化和改变孔栏半径时杂质的变化情况,观察了等离子体发生小破裂时出现的光谱现象,对杂质的来源及某些性质作了分析研究;使用两条CⅣ谱线强度比,测出了放电初期的电子温度。
This article describes the UV-Vis spectroscopy (300-2000A) experiments performed on an HL-1 device. The plasma spectrum was taken out with the micro-channel plate image enhancer to identify and analyze the spectrum. The change of the spectral line with time and the change of the impurities in the radius of the aperture column were measured by photoelectric method. The spectral phenomenon of rupture, the source of impurities and some properties of the analysis were studied; using two C Ⅳ line intensity ratio, measured the initial discharge of electronic temperature.