论文部分内容阅读
本文对偏移剖面上的假频、频散和横向分辨力作了比较系统的论述。通过这种讨论,说明了偏移剖面上的假频与偏移方法无关,而主要与记录和算子的采样及重采样有关;频散现象的产生与偏移方程的精度和差分的精度有关;而横向分辨力则与方程的精度和采样率有关。偏移时应用更精确的方程和更精确的采样,不但对偏移归位有好处,而且对提高横向分辨力也是必须的。
In this paper, the aliasing frequency, dispersion and transverse resolution on migration profiles are systematically discussed. Through this discussion, it is shown that the aliasing frequency in the offset profile is independent of the offset method, but mainly related to the sampling and resampling of the recording and the operator. The generation of dispersion is related to the accuracy of the offset equation and the accuracy of the difference ; While the horizontal resolution is related to the accuracy of the equation and the sampling rate. Applying more accurate equations and more accurate sampling of offsets is not only good for offsets, but it is also necessary to improve horizontal resolution.