细胞膜的破坏可能是导致种子老化过程中生活力丧失的许多过程之一。吸胀种子的电介质渗漏与田间发芽率呈负相关,且是度量种子生活力的一种尺度。电介质的渗漏无疑与质膜的结构和功能状态相联系。电镜下无生活力种胚的质膜破坏、变形。细胞化学试验也可看到某种磷脂的减少和质膜腺三磷酶活性的丧失。实 Cell membrane destruction may be one of the many processes leading to the loss of viability during seed aging. The dielectric leakage of the swollen seeds is negatively correlated with the germination rate in the field and is a measure of the viability of the seeds. The leakage of the dielectric is undoubtedly linked to the structure and function of the plasma membrane. Plasma membrane destruction and deformation of non viable embryos under electron microscope. Cytochemical assays also show a reduction of certain phospholipids and a loss of plasma membrane ATPase activity. real