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5. Atomic force microscopy studies of SrTiO3 (001) substrates treated by chemical etching and annealing

Atomic force microscopy studies of SrTiO3 (001) substrates treated by chemical etching and annealing

来源 :中国科学：物理学、力学、天文学英文版 | 被引量 : 0次 | 上传用户：woshizzh1713

【摘 要】

：

The SrTiO3 (001) substrates treated by chemical etching in NH4F-buffered HF solution and annealing in oxygen ambient have been studied by an atomic force micros

【作 者】

：

WANG Xu FEI Yiyan LU Huibin JI 

【机 构】

：

BeijingNationalLaboratoryforCondensedMatterPhysics,DepartmentofPhysics

【出 处】

：

中国科学：物理学、力学、天文学英文版

【发表日期】

：

2005年4期

【关键词】

：

SrTiO3 AFM SURFACE morphology SURFACE defects. SrTiO3  AFM  surface morpholog 

【基金项目】

：

中国科学院资助项目，the Overseas Outstanding Young Scientist Programme of Chinese Academy of Sciences

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The SrTiO3 (001) substrates treated by chemical etching in NH4F-buffered HF solution and annealing in oxygen ambient have been studied by an atomic force microscopy (AFM). The SrTiO3 substrates with TiO2-termineted and atomically smooth surfaces and singl

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