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本文论述了总的辐射剂量对9个STL和大批量生产的I~2L大规模集成电路的影响,研究这些器件的目的是为了实现全局定位系统(GPS)的功能。在输出大电流时,I~2L器件的输出电压V_(OL)对辐射敏感,然而在较小的输出电流时,只有实验的辐射剂量达到最大值1×10~6拉德时,辐射才对V_(OL)起作用。相应地STL器件不受辐射的影响。本文还论述了辐射试验的诊断作用,给出了重新设计的抗辐射电路之一的实验结果。
This article discusses the effect of the total radiation dose on nine STLs and the mass production of I ~ 2L LSIs. The purpose of these devices is to implement the Global Positioning System (GPS) function. When the output current is large, the output voltage V OL of I ~ 2L devices is sensitive to radiation. However, when the output current is small, the radiation dose is only 1 × 10 ~ 6 rad when the experimental radiation dose reaches the maximum V_ (OL) work. Accordingly, STL devices are immune to radiation. This article also discusses the diagnostic role of radiation testing and presents experimental results of a redesigned anti-radiation circuit.