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本文采用数字处理技术对高速ADC的微分相位、微分增益的测试方法进行研究 ,给出了方程式 ,构建了数字测试系统 ,完成了高速ADC微分相位及微分增益的测试 ,该方法适用于大批量的ADC动态参数的测试 .
This paper uses digital processing technology to study the test method of differential phase and differential gain of high-speed ADC, gives the equation, constructs the digital test system and completes the test of differential phase and differential gain of high speed ADC. This method is suitable for high-speed ADC dynamic parameters of the test.