微量硫的测定方法已报导的有次甲基蓝比色法、极谱法、荧光光度法等。关于砷化镓等半导体材料中微量硫的测定,曾报导过在高温下加热试样並通入氢气的还原气化法,使试样中硫的化合物转变为硫化氢,后者被吸收于氢氧化钠溶液,然后以极谱法测定,但空白值较高。也有化学还原蒸馏分离富集硫的报导。由于荧光光度法灵敏度高,曾被用来测定大气中硫化氢,近年来国内也有人以此法测定钢铁及纯金属中微量硫。 Determination of trace sulfur has been reported methine blue colorimetric method, polarography, fluorescence spectrophotometry. In the measurement of trace sulfur in semiconductor materials such as gallium arsenide, there has been reported a reduction gasification method in which a sample is heated at a high temperature and hydrogen gas is introduced, and the sulfur compound in the sample is converted into hydrogen sulfide which is absorbed in hydrogen Sodium oxide solution, then polarographic determination, but higher blank value. There are also reports of chemical reduction and separation of sulfur by enrichment. Due to the high sensitivity of fluorescence spectrometry, it has been used to determine the hydrogen sulfide in the atmosphere. In recent years, some people in China have also used this method to determine trace sulfur in steel and pure metal.