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介绍了两种长期储存寿命的考核方法,通过对晶体管输出型光电耦合器进行加速寿命试验,记录数据并进行统计分析,利用寿命模型推算出了晶体管输出型光电耦合器常温下的储存寿命。
Two kinds of evaluation methods of long-term storage life are introduced. Accelerated life test of transistor output optocoupler is carried out. The data are recorded and analyzed statistically. The storage life of the transistor output photocoupler at ambient temperature is deduced from the life model.