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本文介绍了对MOS随机存储器几种常用的测试图案和测量方法,分析了下雨检验法的图案规律性,提出了用逻辑线路产生下雨检验标准码。详细地讲述了用硬件实现这些测试方法和复杂图案的具体线路。
This paper introduces several commonly used test patterns and measuring methods for MOS random access memory, analyzes the pattern regularity of the rain test method, and raises the test standard code for raining with logic lines. Described in detail with the hardware to achieve these test methods and complex lines of the specific pattern.