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引言为了提高产品或零部件的耐磨性、耐锉性或改善其外观装饰,常在其表面涂(镀)一层很薄的保护层或装饰层。由于这些涂层的厚度不仅会影响产品质量,还与产品成本密切有关,因此对涂层厚度进行快速无损检测有着明显的实用价值和经济效益。X 射线荧光测厚是70年代迅速发展起来的一项新技术,β射线反散射测厚早在50年代已用来测量较大面积涂层的平均厚度,这些都属于非破坏性无损检洲方法。但是β射线反散射测厚有它的局限性,只有当涂层和基底材料的原子序数差大于二者平均值的
Introduction In order to improve the wear resistance of products or components, filing or improve the appearance of decorative, often coated (plated) a thin protective layer or decorative layer. Since the thickness of these coatings not only affects the quality of the product, but also is closely related to the cost of the product, the rapid and non-destructive testing of the thickness of the coating has obvious practical value and economic benefits. X-ray fluorescence thickness measurement was developed rapidly in the 1970s as a new technique. Β-ray backscatter thickness measurement has been used to measure the average thickness of large area coatings as early as the 1950s, all of which are non-destructive non-destructive methods . However, beta-ray backscatter thickness has its limitations, only when the atomic number difference between the coating and the substrate material is greater than the average of the two