一般说来,无论是结型还是绝缘栅型场效应管,在动态条件下测试更为实际,但是,动态测试比较麻烦,在条件差的情情况下,用万用表可粗略测试场效管的好坏。以结型场效应管3DJ6为例。S为源极,D为漏极,G为栅极。如图1。从结型场效应管的结构可知,栅极G与源极S和漏极D之间呈二极管特性;源极S与漏极D之间呈电阻特性。 In general, both the junction or insulated gate FET, the test under dynamic conditions more practical, however, dynamic test is too much trouble, in the case of poor conditions, with a multimeter can be a rough test of field-tube Bad. Junction FET 3DJ6 as an example. S is the source, D is the drain, and G is the gate. Figure 1. It can be seen from the structure of the junction field effect transistor that a diode characteristic exists between the gate G and the source S and the drain D, and a resistance characteristic exists between the source S and the drain D.