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抽真空充氩激发条件下,测定了Cu元素的单次火花脉冲放电时的几种原子线和离子线的放电强度随着氩气气氛压力变化的情况。它的原子谱线和离子谱线的放电信号随时间变化的峰形有很大差异。原子共振线CuⅠ324.75 nm的峰宽要大于离子线CuⅡ213.60 nm的峰宽。对于CuⅠ324.75 nm谱线,其单次放电寿命几乎与氩气压力无关,在随时间变化的峰形中包含一个初始峰和一个较大的后端拖尾峰,在氩气压力增大时拖尾峰更加明显。对于CuⅡ213.60 nm谱线,其单次放电寿命在不同氩气压力条件下有一定变化,在随时间变化的峰形中包含一个初始峰和一个小的后端拖尾峰。在每一次火花脉冲放电中,激发机理是随时间变化而变化的,因此上述现象就可以从它们的激发机理的不同得以解释。
Under the conditions of argon-induced vacuuming, the discharge intensities of several atomic and ionic wires during the single-spark pulse discharge of Cu were measured as the pressure of argon gas changed. Its atomic and ion spectral line discharge signals vary greatly with the peak shape over time. The peak width of CuI at 324.75 nm for the atomic resonance line is larger than the peak width of CuII213.60 nm on the ion beam. For CuI324.75 nm spectra, the single discharge lifetime is almost independent of argon pressure, including an initial peak and a larger rear tailing peak in the time-varying peak shape. When the argon pressure is increased Trailing peak more obvious. For Cu Ⅱ 213.60 nm, the single discharge lifetimes vary under different argon pressures, with an initial peak and a small rear tailing peak in the peak shape over time. In each spark pulse discharge, the excitation mechanism changes with time, so the above phenomenon can be explained by their different excitation mechanism.