北京分析测试学术报告会暨展览会(Beijing Conference and Exhibition on Instrumental Analysis),简称BCEIA,始办于1985年。BCEIA在有关部门的领导下,以及有关专家、科研院所、企业的关心支持下,经历28年的不断培育和发展,每两年举办一届,连续成功地举办了十五届,现已成为国内分析测试界专业化程度和知名度高的盛会,是与美国匹兹堡会议(PITTCON)、日本分析机器工业会(JASIA)和德国慕尼黑国际展览 Beijing Conference and Exhibition on Instrumental Analysis and Exhibition (Beijing Conference and Exhibition on Instrumental Analysis), referred to as BCEIA, was founded in 1985. Under the leadership of relevant departments and with the concern and support of relevant experts, research institutes and enterprises, BCEIA has continuously cultivated and developed for 28 years. It has been held every two years and has been successfully held for fifteen consecutive years. Now it has become The high profile and high profile event of the domestic analytical and testing community was held in cooperation with PITTCON, JASIA and the International Exhibition in Munich, Germany