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用偏光显微镜、扫描显微镜、透射电镜等方法对全氟磺酸和全氟羧酸膜中的“晶点”进行形貌研究发现，所谓“晶点”不存在明显的各向异性差别，羧酸“晶点”表面由一些颗粒状物组成，不耐电子轰击，产生放电现象。而磺酸“晶点”表面较密实，与周围膜有较明显边界，电子轰击时无放电现象，透射电镜的电子衍射图均呈弥散的德拜环。用红外光谱法和差示扫描量热法对两种树脂的热稳定性进行研究发现，“晶点”形成原因是树脂中不稳定羧端基在一定温度条件下缩聚而形成的，这一结论进一步在热裂解红外光谱研究中得到证实
Morphology of “crystal points” in perfluorosulfonic acid and perfluorocarboxylic acid films was observed by means of polarizing microscope, scanning microscope and transmission electron microscope. The results showed that there was no obvious anisotropy difference between the so-called “crystal points” The “crystal point” surface consists of some particles, impatient with electron bombardment, resulting in discharge. The sulfonic acid “crystal point” surface more compact, with the surrounding membrane has a more obvious boundary, no electron bombardment when the phenomenon of discharge, electron microscopy TEM diffraction showed diffuse Debye ring. The infrared spectroscopy and differential scanning calorimetry study of the thermal stability of the two resins found that the “crystal point” is due to the formation of unstable carboxyl end groups in the resin polycondensation at a certain temperature conditions, this conclusion Further confirmed in the pyrolyzed infrared spectroscopy