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半导体激光器低频电噪声的大小受器件潜在缺陷的影响,与器件可靠性具有相关性。介绍了半导体激光器噪声测试及参数提取的原理,设计了基于超低噪声前置放大器和低频频谱分析仪的低频电噪声测试系统,可测量半导体激光器的低频电噪声并提取相关噪声参数,进而通过低频电噪声的研究对半导体激光器进行可靠性评价,具有灵敏度高、非破坏性等优点。
The magnitude of low frequency electrical noise in semiconductor lasers is affected by the potential defects of the device and is correlated with device reliability. The principle of semiconductor laser noise test and parameter extraction is introduced. A low frequency electrical noise test system based on ultra-low noise preamplifier and low frequency spectrum analyzer is designed to measure low frequency electrical noise of semiconductor laser and extract relevant noise parameters, The research of electrical noise on the semiconductor laser reliability evaluation, with high sensitivity, non-destructive advantages.