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本文介绍了彩色显象管暗角余量的测试方法及通过中束与边束暗角余量差,求取电子在偏转场内的轨迹,然后确定和调整过渡区形状的方法。
This paper introduces the test method of the dark corner residual of color CRT and the method of determining the trajectory of the electron in the deflection field through the margin difference between the center beam and the edge beam, then determines and adjusts the shape of the transition area.