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在金属／绝缘层／金属（Ｍｅｔａｌ／Ｉｎｓｕｌａｔｏｒ／Ｍｅｔａｌ，ＭＩＭ）隧道结发光中，粗糙度与表面等离电磁场量子（ＳｕｒｆａｃｅＰｌａｓｍｏｎＰｏｌａｒｉｔｏｎ，ＳＰＰ）的耦合起着非常重要的作用．本文利用原子力显微镜摄得发光ＭＩＭ隧道结粗糙表面的照片，研究了粗糙度分布的统计结果与测得的发光光谱之间的关系．
In metal / insulator / metal (MIM) tunnel junction luminescence, the coupling of roughness and surface plasmon polariton (SPP) plays a very important role. In this paper, a photograph of the rough surface of a luminescent MIM tunnel junction is taken with an atomic force microscope, and the relationship between the statistical result of the roughness distribution and the measured luminescence spectrum is studied.