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大豆灰斑病是一种由大豆灰斑病菌引起的真菌性病害,会导致大豆叶片出现病斑、大豆籽粒斑驳,造成减产和品质下降,对大豆生产有重要影响。研究通过田间试验对142份育成大豆新品种(系)的灰斑病抗性进行鉴定,进而对大豆灰斑病抗性资源进行评估。利用前期开发的功能分子标记进行候选基因关联分析,筛选得到两个与大豆灰斑病抗性相关的SCAR标记,可用于大豆抗灰斑病的分子辅助育种研究。测序分析发现,它们定位于两个磷脂酶D基因内含子上,是由大豆转座子插入突变形成的。这两个SCAR标记具有功能基因靶向和操作简便等优点,具有广阔的大豆抗灰斑病育种应用前景。
Soybean leaf spot is a fungal disease caused by Cercospora sojino, which leads to the appearance of spot in soybean leaves and mottle of soybean seeds, resulting in the decrease of yield and quality, which has an important impact on soybean production. The objective of this study was to identify the resistance of gray mold disease to 142 soybean cultivars (lines) by field experiments. The functional molecular markers developed in the early stage were used to analyze the candidate genes, and two SCAR markers related to the resistance to soybean gray leaf spot were screened for the molecular assisted breeding of soybean against gray leaf spot. Sequencing analysis revealed that they were located on the intron of two phospholipase D genes and were formed by the insertion of the soybean transposon. These two SCAR markers have the advantages of gene targeting and ease of operation, and have broad application prospect of resistance to Cercospora sojae.