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空间辐射环境严重影响星载SRAM(Static Random Access Memory)型FPGA(Field Programmable Gate Array)的可靠性,提出了星载SRAM型FPGA可靠性快速验证评估方法.在传统故障注入验证的基础上,引入可靠性预评估技术,在逻辑门级分析单粒子翻转对FPGA配置信息位的影响,同时对TMR(Triple Modular Redundancy)冗余方式进行单粒子翻转关键位置评估.然后构成不同敏感级别的故障序列,最后根据应用需求选择不同故障序列进行故障注入从而有效快速评估系统可靠性.该方法与逐位翻转相比,能够在保证故障覆盖率的同时,有效地减少实验时间,提高实验效率.
The space radiation environment seriously affects the reliability of the Field Programmable Gate Array (SRAM) -based FPGA and presents a fast and reliable method for the verification and verification of the spaceborne SRAM FPGA.On the basis of traditional fault injection verification, Reliability pre-evaluation technique to analyze the effect of single-event flip-flops on the FPGA configuration information bits at the logic gate level, as well as to evaluate the critical position of the single-module TFP (Triple Modular Redundancy) redundancy mode, and then constitute fault sequences with different sensitivity levels, Finally, according to the application requirements, different fault sequences are selected for fault injection to effectively and quickly evaluate the system reliability. Compared with bit-by-bit inversion, this method can effectively reduce the experimental time and improve the experimental efficiency while ensuring fault coverage.