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X 射线荧光分析是材料组成控制分析的最有前途的方法之一。其特别值得重视的优点是:可测定的元素数目及其含量范围广;测定的重现性好、快速,同时可以不破坏固体和液体样品;分析信号与待测元素含量间的定量关系较简单;这种方法可被用于生产部门的自动分析控制系统。X 射线荧光分析法的缺点有:元素的检出限(c_(min.p)≥10~(-3)%)高;检出限与相对标准偏差(Sr)和基体效应关系密切;计算分析样品的均匀性对分析信号的影响,是一项极其复杂的任务;难以制备出多组分的标准样品或参比样品。为了改善(降低)其检出限,在提高有效信号与背景比值的基础上,曾提出过若干新的 X 射线荧光分
X-ray fluorescence analysis is one of the most promising ways to control the composition of materials. The particular merits of its attention are: the number of elements that can be determined and its wide range of content; determination of reproducibility is good, fast, and can not damage the solid and liquid samples; quantitative analysis of the signal and the relationship between the elements to be measured is relatively simple This method can be used in the production department’s automated analysis control system. The disadvantages of XRF are: the detection limit (c_ (min.p) ≥10 ~ (-3)%) of the element is high; the detection limit is closely related to the relative standard deviation (Sr) and the matrix effect; The uniformity of the sample is an extremely complex task for analyzing the influence of the signal; it is difficult to prepare a multi-component standard or reference sample. In order to improve (reduce) the detection limit, on the basis of improving the ratio of the effective signal to the background, several new X-ray fluorescence points