综述了近年来用扫描隧道显微镜 (STM )和扫描力显微镜 (SFM)在原子水平上观测辐射损伤潜径迹的研究及进展。详述了辐射损伤潜径迹的形貌、损伤范围、损伤数密度、损伤几率等 ,对损伤潜径迹直径与能损的关系、损伤过程及各种可能的损伤机制进行了分析和讨论。 In this paper, the recent progress in the investigation of the latent track of radiation damage at the atomic level by scanning tunneling microscope (STM) and scanning force microscopy (SFM) is reviewed. The morphology, extent of injury, density of injury, probability of injury and so on of the latent track of radiation damage are described in detail. The relationship between the diameter and energy loss of the track, the process of injury and various possible damage mechanisms are analyzed and discussed.