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为实现对高功率半导体激光器快速、有效、无损的质量检测和可靠性筛选,对器件进行了电导数和光导数测试及分析。结果表明高功率半导体激光器的结电压饱和特性与其质量和可靠性紧密相关。结电压饱和特性不好的器件一般都存在某种缺陷,结电压饱和特性的差异超出一定范围的同种类器件一定是质量和可靠性差的器件。因此,阈值处电导数曲线的下沉高度h值可作为器件筛选的一个判据。用模拟测量的方法,对阵列器件和组成它的单元器件的电压饱和特性的相关性进行了研究,阵列器件的电压饱和特性与组成它的单元器件的一致性(均匀性)紧密相关。均匀性不好的器件的电压饱和特性也不好。
In order to achieve fast, effective and non-destructive quality inspection and reliability screening of high power semiconductor lasers, the devices were tested and analyzed for their conductance and optical conductance. The results show that the junction voltage saturation characteristics of high power semiconductor lasers are closely related to their quality and reliability. Devices with poor voltage saturation characteristics generally have some drawbacks. Devices of the same type with differences in junction voltage saturation characteristics beyond a certain range must be of poor quality and reliability. Therefore, the value of the height h of the conductance curve at the threshold can be used as a criterion for device screening. The dependence of the voltage saturation characteristics of the device on the array and its components is studied by means of analog measurement. The voltage saturation characteristics of the device are closely related to the uniformity (uniformity) of the devices constituting it. Devices with poor uniformity also have poor voltage saturation characteristics.