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使用cromemco微处理机,采用FORTRAN-77语言,针对未知粉末试验样品,由原始试验数据——入射X射线的波长、照相法中每条衍射线的相对坐标,衍射仪法中的衍射角,可以判断被测样品属于何种晶系;可以粗略地求出被测样品的点阵常数并标出每条衍射线的晶面指数;利用外推法进而可以获得被测样品的精密点阵常数,分析了本程序所依据的原理;介绍了微处理机程序;采用本程序对若干立方、六方、正方晶系的样品进行了成功的标注。
Using the cromemco microprocessor in the FORTRAN-77 language for unknown powder test samples, from raw test data - the wavelength of the incident X-ray, the relative coordinates of each diffraction line in the photography method, the diffraction angle in the diffractometer method, Judging which crystal system belongs to the sample to be tested, the lattice constant of the sample to be measured can be roughly calculated and the crystal face index of each diffraction line can be marked. Using the extrapolation method, the precise lattice constant of the sample to be measured can be obtained, The principle of the program is analyzed. The microprocessor program is introduced. Some samples of cubic, hexagonal and tetragonal system are marked successfully by this program.