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根据动态卡计法原理设计了可同时测定金属材料和以金属材料为底材的涂层在50～300℃温度范围内的半球向全发射率和定向吸收率的实验装置。该装置用单板机采集和处理数据,可一次直接测得发射率和吸收率两个重要数据及其随温度的变化情况。
According to the principle of dynamic card counting, an experimental device that can simultaneously measure the hemispherical full emissivity and the directional absorptivity of a metallic material and a metallic material as a substrate in a temperature range of 50-300 ° C is designed. The device uses a single board machine to collect and process data, can be a direct measurement of emissivity and absorption rate of two important data and its temperature changes.