本文用X射线光电子谱(XPS)法对环氧胶和被粘物(钢和氧化铝)粘接界面各元素的化学状态进行了研究。结果表明:界面处元素N、O、Fe、Al发生了化学位移,从而证实了粘接界面配位键的存在。 In this paper, X-ray photoelectron spectroscopy (XPS) was used to study the chemical state of each element in the interface between epoxy adhesive and adherend (steel and alumina). The results show that the chemical shifts of the elements N, O, Fe and Al occur at the interface, which confirms the existence of coordination bonds in the bonding interface.