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X 射线荧光分析已成为现代分析化学中重要手段之一,应用也很广泛,但是基体效应比较严重,在一定程度上阻障着该技术的进一步发展。因此,消除基体效应的影响,一直是 X射线荧光分析工作者的努力方向之一。为了在分析过程中不出现基体效应的影响,本文利用X射线荧光强度与背景强度之间的关系,提出了一种定量分析方法——“背景峰值法”。
X-ray fluorescence analysis has become one of the most important means in modern analytical chemistry. It is also widely used, but the matrix effect is rather serious, which hinders the further development of this technology to a certain extent. Therefore, eliminating the effect of matrix effect has been one of the efforts of X-ray fluorescence analysis workers. In order to avoid the influence of matrix effect in the analysis process, this paper presents a quantitative analysis method - “background peak method ” by using the relationship between X-ray fluorescence intensity and background intensity.