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一、前言试样中织构的存在往往会严重地干扰衍射强度的正确测定,给X射线衍射定量相分析带来困难。Si粉在制样过程中会产生不同程度的织构显示出这种影响。因此根据“冶金部制定X射线定量相分析标准”专题湛江会议精神,决定成立北京,昆明、上海和四川四个实验组,用Htorta的反极图法和Gullberg的多线法来校正Si粉在制样过程中择优取向引起的衍射强度误差,消除织构对定量相分析的影响。二、实验条件 1.样品制备: (1)被测物质:细Si粉和粗Si粉。 (2)参考物质:ZnO粉 (3)配比: 细Si粉:ZnO粉=1:1,2:8,8:2。粗Si粉:ZnO粉=1:1,2:8,8:2。以上配比用来测量K值。细Si粉+70％ZnO+x 粗Si粉+75％ZnO+x以上配比用来测定Si含量。纯试剂由冶金部钢铁研究总院提供。并由攀钢钢研所负责配制不同配比及未知含量
I. Preface The existence of texture in the sample often seriously interferes with the correct determination of diffraction intensity, which brings difficulties to the quantitative phase analysis of X-ray diffraction. Si powder in the sample preparation process will produce different degrees of texture shows this effect. Therefore, according to the theme of Zhanjiang Conference on the Standard of Quantitative Phase Analysis for X-ray Metallurgy, the authors decided to set up four experimental groups in Beijing, Kunming, Shanghai and Sichuan to calibrate Si powder with Htorta’s anti-polar graph method and Gullberg’s multi-line method The error of diffraction intensity caused by the preferred orientation during sample preparation eliminates the influence of texture on quantitative phase analysis. Second, the experimental conditions 1. Sample Preparation: (1) the test substance: thin Si powder and coarse Si powder. (2) reference material: ZnO powder (3) ratio: fine Si powder: ZnO powder = 1: 1,2: 8,8: 2. Crude Si powder: ZnO powder = 1: 1, 2: 8, 8: 2. The above ratio is used to measure K value. Fine Si powder + 70% ZnO + x coarse Si powder + 75% ZnO + x The above ratio was used to determine the Si content. Pure reagents provided by the Institute of Iron and Steel Research Institute of Metallurgy. Panzhihua Iron and Steel Research Institute is responsible for the preparation of different ratio and unknown content