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由电子组件组成的成败型产品从长时间工作的角度来说服从指数分布,但从短时间完成任务的角度来说,试验结果又服从二项分布。在进行可靠性预计时,应考虑其预期的总工作时间,来进行可靠性预计。
Success or failure products made up of electronic components follow the exponential distribution from a long-term perspective, but the results of the experiment follow the binomial distribution from a short-term task. When making reliability estimates, the expected total working time should be taken into account to make reliability estimates.