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本文介绍了一种利用InGaAs/I半导体激光器作为辅助测量光源 ,利用遮蔽板作为标准噪声辐射源 ,以钽酸锂热释电探测器作光接收器件 ,并以 80 31单片机为核心实现的测量静止及慢速运动的中、高温物体的比辐射率及温度的系统。该系统主要由光学发射与接收系统、信号放大与处理系统及显示系统三部分组成。详细介绍了该系统的工作原理与基本结构 ,讨论了其中的技术难点及其相应的解决方法 ,分析了各量的测量精度对比辐射率及温度测量精度的影响。结果表明 :对 4 0 0℃的钢铸件而言 ,比辐射率的测量精度σελ≈ 6 78× 10 -3 ,|σελ/ελ|≈ 1 31% ;温度的测量精度σT≈ 1.0 4k ,|σT/T|≈ 0 15 5 %。
In this paper, we introduce an InGaAs / I semiconductor laser as an auxiliary measurement light source, using a shielding plate as a standard noise radiation source, lithium tantalate pyroelectric detector as a light receiving device, and 8031 single-chip microcomputer as the core to achieve the measurement of static And slow motion of medium and high temperature objects than emissivity and temperature system. The system is mainly composed of optical transmitting and receiving system, signal amplification and processing system and display system. The working principle and basic structure of the system are introduced in detail. The technical difficulties and corresponding solutions are discussed. The influence of the measurement accuracy of each volume on emissivity and temperature measurement accuracy is analyzed. The results show that the measurement accuracy of specific emissivity σελ≈6 78 × 10 -3 and | σελ / ελ | ≈1131% for the steel castings at 400 ℃, the temperature measurement accuracy σT≈ 1.0 4k, | σT / T | ≈ 0 15 5%.