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提出了一种通过两次系统倾转操作精确测定透射电镜中入射电子束方向B的新方法,它不依赖于菊池线或菊池极,但精度可与传统的菊池极法相当,可以满足晶体缺陷衍衬图像计算机模拟等工作的需要。
A new method for accurately measuring the direction of incident electron beam B in a transmission electron microscope by two system tilting operations is proposed. It does not depend on the Kikuchi line or Kikuchi pole, but its accuracy is comparable to that of the conventional Kikuchi pole method, and the crystal defect The requirements of computer simulation and other work of supporting images.